Sean's ICMTS Page 
    Well if you really are bored you can have a look at these.

    S.D. Connor; D. Evans; " Automated Extraction of Matching Parameters for Bipolar Transistor Technologies ",Proceedings of IEEE International Conference on Microelectronic Test Structures, pp33-38, March 25-28, 1996.
     

    S.D. Connor; " On Wafer Noise Measurement Using BipolarTransistor RF TestStructures",Proceedings of IEEE International Conference on Microelectronic Test Structures, pp43-48, March 17-20, 1997.
     

    S.D. Connor; " Measurement of '1/f' Noise in Poly-silicon Emitter Bipolar Transistor
    Structures ",Proceedings of IEEE International Conference on Microelectronic Test Structures, pp33-38, March 153-157, 1998.