Sean's ICMTS Page
Well if you really are bored you can have a look at these.
S.D. Connor; D. Evans; "
Automated Extraction of Matching
Parameters for Bipolar Transistor Technologies ",Proceedings
of IEEE International Conference on Microelectronic Test Structures,
pp33-38, March 25-28, 1996.
S.D. Connor; " On
Wafer Noise Measurement Using BipolarTransistor RF
TestStructures",Proceedings of IEEE
International Conference on Microelectronic Test Structures,
pp43-48, March 17-20, 1997.
S.D. Connor; " Measurement
of '1/f' Noise in Poly-silicon Emitter Bipolar Transistor
Structures ",Proceedings of IEEE International Conference on Microelectronic Test Structures, pp33-38, March 153-157, 1998.
M.C. Wilson , S Nigrin, S.J. Harrington A.J. Manson, S. Thomas, S.D. Connor, P. H. Osborne . “A 12 Volt 12 GHz Complementary Bipolar Technology For High Frequency Analogue Applications”, Proceedings of the IEEE 32th European Solid-State Device Research Conference , pp375-378, Sept 24-26, 2002.
S Nigrin, M.C. Wilson , S. Thomas, S.D. Connor, P. H. Osborne
“A Complementary Bipolar Technology on SOI Featuring 50GHz NPN and 35 GHz PNP
Devices for High Performance RF Applications”, Proceedings of the IEEE International SOI Conference , Oct 7-10, 2002.
M C Wilson, S Nigrin, S J Harrington, A J Manson, S Thomas and S Connor; "A Modular Approach to the Manufacture of a High Performance Complementary Bipolar Technology Family" Semicon 2004
S.D. Connor, S.J. Harrington, A.J.Manson, S. Nigrin, S. Thomas and M.C. Wilson; "Automated On-wafer Measurement of Noise Figure and Base Spreading Resistance"
Proceedings of the 7th International Conference on Solid-State and Integrated-Circuit Technology October 18-21, 2004, Beijing, China ICSICT'2004.
L. Tan†, M. M. A. Hakim, S. Connor , A. Bousquet , W. Redman-White, P. Ashburn, S. Hall. Characterisation of CMOS Compatible Vertical MOSFETs with New Architectures through EKV Parameter Extraction and RF Measurement.
Proceedings of ULIS 2009 March 18-19 Aachen, Germany